Research and Development of Test Model Platform Based on Defect Analysis

Research and Development of Test Model Platform Based on Defect Analysis

연구 분야: Analysis

학회: 2024 4th Asia-Pacific Conference on Communications Technology and Computer Science (ACCTCS)

With the continuous development of the equipment, the scale and complexity of software are increasing. Software defect testing has become the focus of software testing technology. How to carry out effective defect analysis is particularly important. In view of the characteristics of the equipment multi-task information control platform, the development of test model platform based on defect analysis is studied in the software construction stage. By repairing these defects, the number of defects in software products can be reduced, the product development cycle can be shortened, and the quality and reliability of software products can be effectively improved.