Automated Examination System using Machine Learning and Natural Language Processing


연구 분야: Artificial Intelligence



학회: IC3-2024: Proceedings of the 2024 Sixteenth International Conference on Contemporary Computing


초록

Traditional examination processes are burdened with inefficiencies and vulnerabilities that hinder the educational process. Manual tasks such as question formulation and answer grading consume significant time and resources, while security concerns regarding physical exam materials persist. In response, this paper proposes an automated examination system leveraging advanced technological tools such as machine learning and natural language processing. By addressing the shortcomings of traditional methods and enhancing efficiency and security, this system aims to revolutionize academic evaluation.


Author Profile
Aman Bhadouria

Jaypee Institute of Information Technology India

India
Author Profile
Pranav Gupta

Jaypee Institute of Information Technology India

India
Author Profile
Parish Bindal

Jaypee Institute of Information Technology India

India

📄 논문 정보

발행 연도 2024년
인용수 0
출판 국가 India
사이트 ACM
좋아요 수 0

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