BinSide : Static Analysis Framework for Defects Detection in Binary Code

BinSide : Static Analysis Framework for Defects Detection in Binary Code

연구 분야: Verification

학회: 2020 Ivannikov Memorial Workshop (IVMEM)

Software developers make mistakes that can lead to failures of a software product. One approach to detect defects is static analysis: examine code without execution. Currently, various source code static analysis tools are widely used to detect defects. However, source code analysis is not enough. The reason for this is the use of third-party binary libraries, the unprovability of the correctness of all compiler optimizations. This paper introduces BinSide : binary static analysis framework for defects detection. It does interprocedural, context-sensitive and flow-sensitive analysis. The framework uses platform independent intermediate representation and provide opportunity to analyze various architectures binaries. The framework includes value analysis, reaching definition, taint analysis, freed memory analysis, constant folding, and constant propagation engines. It provides API (application programming interface) and can be used to develop new analyzers. Additionally, we used the API to develop checkers for classic buffer overflow, format string, command injection, double free and use after free defects detection.